Leading Analytical Instrumentation

Retsch Technology (Germany)

Particle Analysis Instruments

OPTICAL PARTICLE FROM 0.3 nm TO 30 mm
Dynamic Image Analysis
Laser Light Scattering

Retsch Technology develops and sells state-of-the-art optical measuring systems for particle characterization based on different measurement techniques:

Measuring range from 0.3 nm to 30 mm
Analysis of particle size and particle shape of colloidal materials, emulsions, suspensions, dispersions, powders and granulates.

Dynamic Image Analysis

Dynamic Image Analysis (DIA) is a modern high-performance method for the characterization of particle size and particle shape of powders, granules and suspensions.

Dynamic Image Analysis is used in many industries for quality control as well as in research & development. It increasingly replaces more established methods such as laser diffraction or sieve analysis.

 

Laser Light Scattering

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The most important methods for the characterization of particles in the nanometer and micrometer range are dynamic and static laser light scattering (laser diffraction). The static laser light scattering can be used for the analysis of emulsions, suspensions and dry samples.

 

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Retsch Technology Instruments

Patented Measurement Principle_Funktion-110208-white-GB

Digital Image Analysis

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Camsizer XT X-DRY

Particle Characteristics

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